Thermal properties of TIM using CNTs forest in electronics packaging
Paper i proceeding, 2016
hotspot
VACNT
resistance temperature detector
heat
dissipation
thermal test chip
Författare
Dongsheng Zhang
Shanghai University
Johan Liu
Shanghai University
Shuangxi Sun
Elektronikmaterial och system
Shirong Huang
Shanghai University
Jie Bao
Shanghai University
N. Wang
Shanghai University
Johan Liu
Elektronikmaterial och system
Xiuzhen Lu
Shanghai University
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016; Wuhan Optics Valley Kingdom Hotel Wuhan; China; 16 August 2016 through 19 August 2016
1355-1359
978-150901396-8 (ISBN)
Ämneskategorier (SSIF 2011)
Keramteknik
Materialkemi
Annan materialteknik
DOI
10.1109/ICEPT.2016.7583375
ISBN
978-150901396-8