Thermal properties of TIM using CNTs forest in electronics packaging
Paper in proceeding, 2016
hotspot
VACNT
resistance temperature detector
heat
dissipation
thermal test chip
Author
Dongsheng Zhang
Shanghai University
Johan Liu
Shanghai University
Shuangxi Sun
Electronics Material and Systems
Shirong Huang
Shanghai University
Jie Bao
Shanghai University
N. Wang
Shanghai University
Johan Liu
Electronics Material and Systems
Xiuzhen Lu
Shanghai University
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016; Wuhan Optics Valley Kingdom Hotel Wuhan; China; 16 August 2016 through 19 August 2016
1355-1359
978-150901396-8 (ISBN)
Subject Categories (SSIF 2011)
Ceramics
Materials Chemistry
Other Materials Engineering
DOI
10.1109/ICEPT.2016.7583375
ISBN
978-150901396-8