Raman scattering studies of dilute InP1-xBix alloys reveal unusually strong oscillator strength for Bi-induced modes
Artikel i vetenskaplig tidskrift, 2015
Raman scattering
oscillator strength
InPBi
molecular beam epitaxy
dilute bismides
Författare
W. W. Pan
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
Chinese Academy of Sciences
J.A. Steele
University of Wollongong
P. Wang
Chinese Academy of Sciences
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
K. Wang
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
Chinese Academy of Sciences
Yuxin Song
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
L. Yue
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
X. Wu
Chinese Academy of Sciences
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
H. Xu
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
Chinese Academy of Sciences
Z. Zhang
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
S. Xu
The University of Hong Kong
P. F. Lu
Beijing University of Posts and Telecommunications
L. Wu
Beijing University of Posts and Telecommunications
Q. Gong
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
Shu Min Wang
Chalmers, Mikroteknologi och nanovetenskap (MC2), Mikrovågselektronik
Semiconductor Science and Technology
0268-1242 (ISSN) 1361-6641 (eISSN)
Vol. 30 9Ämneskategorier (SSIF 2011)
Bearbetnings-, yt- och fogningsteknik
Nanoteknik
DOI
10.1088/0268-1242/30/9/094003