Test structures for studying flexible interconnect supported by carbon nanotube scaffolds
Paper in proceeding, 2017

Due to their flexibility and compatibility with silicon devices, the use of carbon nanotubes as scaffolds for metal interconnect in flexible and wearable electronics has been proposed. This paper examines the performance of dual-height carbon nanotubes as flexible scaffolds for horizontal and vertical interconnects. For this purpose, a number of test structures have been designed and fabricated and their electrical and mechanical performance been investigated.

Author

Kjell Jeppson

Electronics Material and Systems

Di Jiang

Electronics Material and Systems

Shuangxi Sun

Electronics Material and Systems

Michael Edwards

Electronics Material and Systems

International Conference on Microelectronic Test Structures

Vol. 2017

Subject Categories (SSIF 2011)

Electrical Engineering, Electronic Engineering, Information Engineering

Nano Technology

More information

Created

10/8/2017