Test structures for studying flexible interconnect supported by carbon nanotube scaffolds
Paper in proceeding, 2017
Author
Kjell Jeppson
Electronics Material and Systems
Di Jiang
Electronics Material and Systems
Shuangxi Sun
Electronics Material and Systems
Michael Edwards
Electronics Material and Systems
International Conference on Microelectronic Test Structures
Vol. 2017
Subject Categories (SSIF 2011)
Electrical Engineering, Electronic Engineering, Information Engineering
Nano Technology