Analysis of WC with increased Ta doping
Journal article, 2015
APT
SEM
XRD
EBSD
Scanning electron microscopy
Author
Jonathan Weidow
Chalmers, Applied Physics, Materials Microstructure
E. Halwax
Technische Universitat Wien
W. D. Schubert
Technische Universitat Wien
International Journal of Refractory Metals & Hard Materials
2213-3917 (eISSN)
Vol. 51 56-60Subject Categories (SSIF 2011)
Metallurgy and Metallic Materials
DOI
10.1016/j.ijrmhm.2015.03.001