Characterization of Interface Defects
Book chapter, 2010
LF noise
Charge pumping
Interface defect
C-V response
Low frequency noise
Author
P.K. Hurley
Tyndall National Institute at National University of Ireland, Cork
Olof Engström
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
D. Bauza
Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation
G. Ghibaudo
Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation
Nanoscale CMOS (ed. Balestra)
545-573
9781848211803 (ISBN)
Subject Categories (SSIF 2011)
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1002/9781118621523.ch15
ISBN
9781848211803