Quantum Hall Effect and Quantum Point Contact in Bilayer-Patched Epitaxial Graphene
Journal article, 2014
monolayer and bilayer graphene
resistance metrology
quantum hall effect
SiC epitaxial graphene
scanning gate microscopy
quantum point contact
Author
C. Chua
University of Cambridge
M. Connolly
National Physical Laboratory
University of Cambridge
Arseniy Lartsev
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Thomas Yager
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Samuel Lara Avila
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Sergey Kubatkin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
S. Kopylov
Lancaster University
V. Fal'ko
Lancaster University
R. Yakimova
Linkopings universitet
R. Pearce
National Physical Laboratory
Tjbm Janssen
National Physical Laboratory
A.Y. Tzalenchuk
National Physical Laboratory
Royal Holloway University of London
C. G. Smith
University of Cambridge
Nano Letters
1530-6984 (ISSN) 1530-6992 (eISSN)
Vol. 14 6 3369-3373Areas of Advance
Nanoscience and Nanotechnology
Subject Categories (SSIF 2011)
Physical Sciences
DOI
10.1021/nl5008757