RF characterization of cold-electron bolometer integrated with a unilateral finline
Paper in proceeding, 2012
e-beam lithography
Millimeter-wave detectors
Nanotechnology
Nanodevices
RF testing
Author
Ernst Otto
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
P. K. Grimes
Smithsonian Astrophysical Observatory
University of Oxford
G. Yassin
University of Oxford
Mikhail Tarasov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Leonid Kuzmin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
S. Withington
University of Cambridge
Proceedings of SPIE - The International Society for Optical Engineering
0277786X (ISSN) 1996756X (eISSN)
Vol. 8452 Art. no. 84521X- 84521X978-081949153-4 (ISBN)
Subject Categories (SSIF 2011)
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1117/12.926201
ISBN
978-081949153-4