The influence of inhomogeneous trap distribution on results of DLTS study
Journal article, 2011
spectroscopy
v7
p399
semiconductors
1989
molecular-beam epitaxy
electron traps
and n
Author
M. Kaczmarczyk
Instytut Technologii Elektronowej
M. Kaniewska
Instytut Technologii Elektronowej
Olof Engström
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
Microelectronics and Reliability
0026-2714 (ISSN)
Vol. 51 7 1159-1161Subject Categories (SSIF 2011)
Physical Sciences
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1016/j.microrel.2011.01.011