Anisotropic transport properties in InAs/AlSb heterostructures
Journal article, 2010
Hall effect
aluminium compounds
semiconductor growth
III-V semiconductors
electric resistance
indium compounds
cooling
dislocations
surface morphology
two-dimensional electron gas
high electron mobility transistors
electron mobility
semiconductor heterojunctions
Author
Giuseppe Moschetti
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Huan Zhao Ternehäll
Chalmers, Applied Physics, Physical Electronics
Per-Åke Nilsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Shu Min Wang
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Alexei Kalaboukhov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
G. Dambrine
Universite des Sciences et Technologies de Lille
Chalmers University of Technology
S. Bollaert
Chalmers University of Technology
Universite des Sciences et Technologies de Lille
L. Desplanque
Universite des Sciences et Technologies de Lille
Chalmers University of Technology
X. Wallart
Chalmers University of Technology
Universite des Sciences et Technologies de Lille
Jan Grahn
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Applied Physics Letters
0003-6951 (ISSN) 1077-3118 (eISSN)
Vol. 97 24 3- 243510Areas of Advance
Nanoscience and Nanotechnology
Materials Science
Subject Categories (SSIF 2011)
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1063/1.3527971