Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers (Invited)
Journal article, 2010
Author
Olof Engström
Chalmers, Microtechnology and Nanoscience (MC2)
Bahman Raeissi
Chalmers, Microtechnology and Nanoscience (MC2)
Johan Piscator
Chalmers, Microtechnology and Nanoscience (MC2)
I. Z. Mitrovic
S. Hall
H. D. B. Gottlob
M Schmidt
Bahman Raeissi
K. Cherkaoui
Journal of Telecommunications and Information Technology
1509-4553 (ISSN) 1899-8852 (eISSN)
Vol. 1 10-Areas of Advance
Information and Communication Technology
Nanoscience and Nanotechnology
Subject Categories (SSIF 2011)
Other Engineering and Technologies not elsewhere specified
Electrical Engineering, Electronic Engineering, Information Engineering