Evaluation of new and improved thermal interface materials and surface roughness effect on thermal interface resistance
Paper in proceeding, 2009
Author
Carl Zandén
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory
Björn Carlberg
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory
Proceedings of the The International 3rd Swedish Production Symposium (SPS)
88-96
978-91-633-6006-0 (ISBN)
Subject Categories (SSIF 2011)
Materials Engineering
ISBN
978-91-633-6006-0