Alok Ranjan

Publications (10)
Projects (0)

Showing 10 publications

2024

Electrodes for High-κ Molecular Crystal Antimony Trioxide Gate Dielectrics for 2D Electronics

Alok Ranjan, Lunjie Zeng, Eva Olsson

Advanced Electronic Materials. Vol. 10 (11)

Journal article

2024

Dielectric Breakdown Mechanisms in High-κ Antimony Trioxide (Sb<inf>2</inf>O<inf>3</inf>)

Alok Ranjan, Lunjie Zeng, Eva Olsson

ACS Applied Electronic Materials. Vol. 6 (11), p. 8540-8548

Journal article

2024

Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators

Tommaso Zanotti, Alok Ranjan, Sean J. O'Shea et al

IEEE Transactions on Device and Materials Reliability. Vol. 24 (2), p. 184-193

Journal article

2024

Estimating the Number of Defects in a Single Breakdown Spot of a Gate Dielectric

Alok Ranjan, Andrea Padovani, Behnood Dianat et al

IEEE Electron Device Letters. Vol. 45 (5), p. 809-812

Journal article

2023

Molecular Bridges Link Monolayers of Hexagonal Boron Nitride during Dielectric Breakdown

Alok Ranjan, Sean J. O'Shea, Andrea Padovani et al

ACS Applied Electronic Materials. Vol. 5 (2), p. 1262-1276

Journal article

2023

Probing resistive switching in HfO<inf>2</inf>/Al<inf>2</inf>O<inf>3</inf> bilayer oxides using in-situ transmission electron microscopy

Alok Ranjan, Hejun Xu, Chaolun Wang et al

Applied Materials Today. Vol. 31

Journal article

2023

Probing Dielectric Breakdown in Single Crystal Hexagonal Boron Nitride

Alok Ranjan, Andrew Yankovich, Kenji Watanabe et al

Microscopy and Microanalysis. Vol. 29 (1), p. 1998-2000

Journal article

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2023

Reliability Analysis of Random Telegraph Noisebased True Random Number Generators

Tommaso Zanotti, Alok Ranjan, Sean J. O'Shea et al

IEEE International Integrated Reliability Workshop Final Report. Vol. 2023 IEEE International Integrated Reliability Workshop, IIRW 2023

Paper in proceeding

2023

Convolution Neural Networks and Position Averaged Convergent Beam Electron Diffraction for Determining the Structure of 2D Materials

Andrew Yankovich, Magnus Röding, Victor Wåhlstrand Skärström et al

Microscopy and Microanalysis. Vol. 29 (1), p. 691-693

Journal article

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2023

Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces

Alok Ranjan, Andrea Padovani, Behnood Dianat et al

ACS Applied Electronic Materials. Vol. 5 (9), p. 5176-5186

Journal article

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