A new method of determining the effective channel width and its dependence on the gate voltage
Paper i proceeding, 1996
A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance.
Data mining
Fluctuations
Performance evaluation
Geometry
Electrical resistance measurement
Voltage
Particle measurements
Robustness
Solid state circuits
Integrated circuit measurements
Författare
Peter R. Karlsson
Institutionen för fasta tillståndets elektronik
Kjell Jeppson
Institutionen för mikroelektronik och nanovetenskap
Institutionen för fasta tillståndets elektronik
Anders Bogren
Institutionen för fasta tillståndets elektronik
Proceedings of the IEEE International Conference on Microelectronic Test Structures ICMTS
Vol. 1996 25-28 March 1996
0-7803-2783-7 (ISBN)
Ämneskategorier (SSIF 2011)
Elektroteknik och elektronik
ISBN
0-7803-2783-7