Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Paper in proceeding, 2014
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.
liposome
imaging
histamine
ToF-SIMS
aqueous two-phase system
depth profile analysis
Author
Jelena Lovric
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Jacqueline Keighron
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Tina B. Angerer
University of Gothenburg
Li Xianchan
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Per Malmberg
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
John Fletcher
University of Gothenburg
Andrew Ewing
University of Gothenburg
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Surface and Interface Analysis
0142-2421 (ISSN) 1096-9918 (eISSN)
Vol. 46 S1 74-78Subject Categories (SSIF 2011)
Chemical Engineering
DOI
10.1002/sia.5623