The EMRP project GraphOhm- Towards quantum resistance metrology based on graphene
Paper in proceeding, 2014
A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.
Measurement standards
resistance
quantum hall effect
graphene
Author
F.J. Ahlers
Physikalisch-Technische Bundesanstalt
J.L. Kučera
Czech Metrology Institute
W. Poirier
Laboratoire National de Metrologie et d'Essais
B. Jeanneret
Federal Institute of Metrology METAS
A.F. Satrapinski
Mittatekniikan Keskus (MIKES)
A.Y. Tzalenchuk
NPL MANAGEMENT LIMITED
P. Vrabček
T. Bergsten
SP SVERIGES TEKNISKA FORSKNINGSINSTITUT AB
C. Hwang
Korea Research Institute of Standards and Science
R. Yakimova
Linkopings universitet
Sergey Kubatkin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
CPEM Digest. 29th Conference on Precision Electromagnetic Measurements, CPEM 2014; Rio de Janeiro; Brazil; 24 August 2014 through 29 August 2014
0589-1485 (ISSN)
548-549978-147995205-2 (ISBN)
Subject Categories (SSIF 2011)
Physical Sciences
DOI
10.1109/CPEM.2014.6898502
ISBN
978-147995205-2