Thermal and electrical instabilities in wafer bonded SiO2 layers

Per Ericsson; Stefan Bengtsson

Thermal and electrical instabilities in wafer bonded SiO2 layers
Journal article, 1994

Author

Per Ericsson

Department of Solid State Electronics

Stefan Bengtsson

Department of Solid State Electronics

Other publications Research

Subject Categories (SSIF 2011)

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017

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