Fabrication of corrugated probes for scanning near-field optical microscopy
Paper in proceeding, 2011
Scanning near-field optical microscopy
Bragg grating
Turner method
SNOM probes
Etching
Corregated SNOM probes
Aperture metal-coated probes
Author
P. Wróbel
Uniwersytet Warszawski
T. Stefaniuk
Uniwersytet Warszawski
Tomasz Antosiewicz
Chalmers, Applied Physics, Condensed Matter Theory
A. Libura
High Pressure Research Center of the Polish Academy of Sciences
G. Nowak
High Pressure Research Center of the Polish Academy of Sciences
T. Wejrzanowski
Politechnika Warszawska
R. Slesinski
Politechnika Warszawska
K. Jedrzejewski
Politechnika Warszawska
T. Szoplik
Uniwersytet Warszawski
Proceedings of SPIE - The International Society for Optical Engineering
0277786X (ISSN) 1996756X (eISSN)
Vol. 8070 80700I978-081948660-8 (ISBN)
Subject Categories (SSIF 2011)
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1117/12.886844
ISBN
978-081948660-8