Charge transfer between epitaxial graphene and silicon carbide
Journal article, 2010
We analyze doping of graphene grown on SiC in two models which differ by the source of charge transferred to graphene, namely, from SiC surface and from bulk donors. For each of the two models, we find the maximum electron density induced in monolayer and bilayer graphene, which is determined by the difference between the work function for electrons in pristine graphene and donor states on/in SiC, and analyze the responsivity of graphene to the density variation by means of electrostatic gates.
bilayer graphene
semiconductor doping
silicon compounds
graphene
work function
monolayers
charge exchange
semiconductor epitaxial layers
epitaxial growth
electron density
transistors
Author
S. Kopylov
Lancaster University
A.Y. Tzalenchuk
National Physical Laboratory
Sergey Kubatkin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
V. I. Fal'ko
Lancaster University
Applied Physics Letters
0003-6951 (ISSN) 1077-3118 (eISSN)
Vol. 97 11 112109New Electronics Concept: Wafer-Scale Epitaxial Graphene (ConceptGraphene)
European Commission (FP7) (257829), 2010-10-01 -- 2013-09-30.
Subject Categories (SSIF 2011)
Physical Sciences
DOI
10.1063/1.3487782