Quantitative XPS Depth Profiling for Nickel/4H-SiC Contact with Layered Structure
Journal article, 2006
Ni/SiC contact
depth profiling
layered structure
XPS
Author
Yu Cao
Chalmers, Materials and Manufacturing Technology, Surface and Microstructure Engineering
Lars Nyborg
Chalmers, Materials and Manufacturing Technology, Surface and Microstructure Engineering
Subject Categories (SSIF 2011)
Materials Engineering