Development of a test platform for thermal characterisation using a Through-Hole Via Technoloyg
Paper in proceeding, 2009
Author
Yifeng Fu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory
Teng Wang
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory
Proceedings of the Annual Nordic Conference
35-38
Subject Categories (SSIF 2011)
Materials Engineering