Multiscale Delamination Modeling of an Anisotropic Conductive Adhesive Interconnect Based on Micropolar Theory and Cohesive Zone Model
Paper in proceeding, 2009

Author

Jinyu Fan

Johan Liu

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems Laboratory

Proceedings of the 2009 International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP)

160-163

Subject Categories (SSIF 2011)

Mechanical Engineering

More information

Created

10/6/2017